Grażyna Bastek et al. Technological Examination of the Warsaw and Boston Versions...
195
examined with the use of XRF and SEM-EDS of the cross-sections leads to the conclusion
that using a scanning microscope brings new information to the technological analysis of
paintings. Proper interpretation of the signals registered during the XRF analysis and match-
ing them with specific pigments and layers in the sample is mainly due to the information
obtained during the stratigraphic examination of cross-sections using such techniques as
SEM-EDS. What is more, the opportunity to map the spatial distribution of chemical elements
in the sample is not to be undervalued. Without taking samples and preparing cross-sections
it would be impossible to confirm, for instance, the occurrence of bismuth, the presence of
which is characteristic of a Raphaelite artist.
BŁK
Translated by Szymon Zuchowski
195
examined with the use of XRF and SEM-EDS of the cross-sections leads to the conclusion
that using a scanning microscope brings new information to the technological analysis of
paintings. Proper interpretation of the signals registered during the XRF analysis and match-
ing them with specific pigments and layers in the sample is mainly due to the information
obtained during the stratigraphic examination of cross-sections using such techniques as
SEM-EDS. What is more, the opportunity to map the spatial distribution of chemical elements
in the sample is not to be undervalued. Without taking samples and preparing cross-sections
it would be impossible to confirm, for instance, the occurrence of bismuth, the presence of
which is characteristic of a Raphaelite artist.
BŁK
Translated by Szymon Zuchowski