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Rocznik Muzeum Narodowego w Warszawie — 3(39).2014

DOI Heft:
Część III. Badania atrybucyjne i technologiczne nad dawnym malarstwem i rysunkiem / Part III. Attribution and Technological Research on Old Master Paintings and Drawings
DOI Artikel:
Bastek, Grażyna; Łydżba-Kopczynska, Barbara; Pilecka-Pietrusińska, Elżbieta; Stefańska, Iwona Maria: Święta Rodzina ze świętym Janem Chrzcicielem i świętą Katarzyną Aleksandryjską Gianfrancesca Penniego - badania technologiczne wersji z Warszawy i Bostonu
DOI Seite / Zitierlink: 
https://doi.org/10.11588/diglit.45362#0196

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Grażyna Bastek et al. Technological Examination of the Warsaw and Boston Versions...

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examined with the use of XRF and SEM-EDS of the cross-sections leads to the conclusion
that using a scanning microscope brings new information to the technological analysis of
paintings. Proper interpretation of the signals registered during the XRF analysis and match-
ing them with specific pigments and layers in the sample is mainly due to the information
obtained during the stratigraphic examination of cross-sections using such techniques as
SEM-EDS. What is more, the opportunity to map the spatial distribution of chemical elements
in the sample is not to be undervalued. Without taking samples and preparing cross-sections
it would be impossible to confirm, for instance, the occurrence of bismuth, the presence of
which is characteristic of a Raphaelite artist.
BŁK
Translated by Szymon Zuchowski
 
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